Facilities
In NPDL
Synthesis and Fabrication
RF/DC Sputtering System (3 Sputtering Guns) Thermal Evaporator with Sputtering System
Glove Box Spray System
Centrifuge High Temperature Furnace Rapid Thermal Annealing System
![ALD4.jpg](http://117.16.247.44/files/attach/images/1074/078/001/9635cdbfea899bd9ecfe5b31c2585079.jpg)
Atomic Layer Deposition System Ball Milling Machine
Characterization
Raman/PL Spectrometer (442 nm, 532 nm, 635 nm, 785 nm, with mapping stage & software)
Thermal Admittance Spectroscopy System(80~300K) Atomic Force Microsocpe (C-AFM, KPFM)
Solar Simulator IPCE Measurement System (350 nm ~1200 nm)
![NIR_TRPL2.jpg](http://117.16.247.44/files/attach/images/1074/078/001/46ae044bafb9c839d3e576f3abfc6979.jpg)
![Infratec3.jpg](http://117.16.247.44/files/attach/images/1074/078/001/c4f503f5c8b0c5d7d36c1d5f73138c68.jpg)
![autolab3.jpg](http://117.16.247.44/files/attach/images/1074/078/001/8d02f76951576911ae6236738fca5483.jpg)
TRPL Measurement System (950nm~1400nm) Lock-in Thermography Potentiostat (with EIS)
Linkam Cryo-Stage (873 ~ 80 K) for Microscope
LCR meter (20 Hz~2 MHz) for thermal admittance spectroscopy (TAS)
Potentiostat (w/ impedance spectroscopy) (Autolab)
Keithley 4200
Ball Milling Machine
In Measurement Center (INU)
HR-TEM
HR-XRD
XPS
FE-SEM
TRPL (UV, Visible)
AFM
Raman/PL (UV, Visible)
FTIR
ICP